AS9120B, ISO 9001:2015, and FAA AC 0056B Accredited
| Item Name | Semiconductor Device Diode |
| Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC) | 5961 Semiconductor Devices and Associated Hardware |
| National Item Identification Number (NIIN) | 00-523-9597 (005239597) |
| NCB Code | USA (00) |
| Manufacturer | Nei Peebles Electric Products Inc, Intersil Corporation, St Semicon Inc, Military Specifications, Solid State Devices Inc, Fmc Technologies Inc, Cooper Industries Inc, Philips Ecg Inc, Lockheed Martin Corporation, Edal Industries Inc, Ems Development Corporation, Freescale Semiconductor Inc, Solitron Devices Inc, Bogue Electric Manufacturing Co, Westinghouse Electric Corp, General Electric Company, Gilbert Engineering Co Inc, Semicon Components Inc, Semitronics Corp, International Diode Corp, Electronic Transistors Corp, Cumberland Electronics Inc, Adelco Elektronik Gmbh |
| Part Number | Manufacturer | Item Name | RFQ |
|---|---|---|---|
| 00914 | nei peebles electric products inc | semiconductor device diode | RFQ |
| 1N1205RA | intersil corporation | semiconductor device diode | RFQ |
| 1N1205RA | st semicon inc | semiconductor device diode | RFQ |
| JANTX1N1206AR | military specifications | semiconductor device diode | RFQ |
| 1N1205RA | solid state devices inc | semiconductor device diode | RFQ |
| 1N1205RA | fmc technologies inc | semiconductor device diode | RFQ |
| 1N1205RA | cooper industries inc | semiconductor device diode | RFQ |
| ECG5883 | philips ecg inc | semiconductor device diode | RFQ |
| 339397-018 | lockheed martin corporation | semiconductor device diode | RFQ |
| 1N1205RA | edal industries inc | semiconductor device diode | RFQ |
| JAN1N1206RA | ems development corporation | semiconductor device diode | RFQ |
| MIL-PRF-19500/260 | military specifications | semiconductor device diode | RFQ |
| 1N1205RA | freescale semiconductor inc | semiconductor device diode | RFQ |
| 1N1205RA | solitron devices inc | semiconductor device diode | RFQ |
| M1LS19500-260 | military specifications | semiconductor device diode | RFQ |
| ECG5883 | bogue electric manufacturing co | semiconductor device diode | RFQ |
| 1N1205RA | westinghouse electric corp | semiconductor device diode | RFQ |
| 1N1205RA | general electric company | semiconductor device diode | RFQ |
| JAN1N1206RA | military specifications | semiconductor device diode | RFQ |
| 864898 | lockheed martin corporation | semiconductor device diode | RFQ |
| 1N1205RA | gilbert engineering co inc | semiconductor device diode | RFQ |
| 1N1205RA | semicon components inc | semiconductor device diode | RFQ |
| JANIN1206AR | general electric company | semiconductor device diode | RFQ |
| 1N1205RA | semitronics corp | semiconductor device diode | RFQ |
| 1N1205RA | international diode corp | semiconductor device diode | RFQ |
| 1N1205RA | electronic transistors corp | semiconductor device diode | RFQ |
| ECG5883 | cumberland electronics inc | semiconductor device diode | RFQ |
| JANTX1N1206RAA | adelco elektronik gmbh | semiconductor device diode | RFQ |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABHP | OVERALL LENGTH | 1.253 INCHES MAXIMUM |
| AKPV | MOUNTING FACILITY QUANTITY | 1 |
| ALAZ | JOINT ELECTRONIC DEVICE ENGINEERING COUNCIL/JEDEC/CASE OUTLINE DESIGNATION | DO-203AA |
| ALBA | ELECTRODE INTERNALLY-ELECTRICALLY CONNECTED TO CASE | ANODE |
| AXGY | MOUNTING METHOD | THREADED STUD |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| CCDG | OVERALL WIDTH ACROSS FLATS | 0.424 INCHES MINIMUM AND 0.437 INCHES MAXIMUM |
| CQJX | NOMINAL THREAD SIZE | 0.190 INCHES |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 720.0 MAXIMUM NONREPETITIVE PEAK REVERSE VOLTAGE AND 600.0 MAXIMUM WORKING PEAK REVERSE VOLTAGE |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 240.00 AMPERES MAXIMUM PEAK FORWARD SURGE CURRENT AND 12.00 AMPERES MAXIMUM AVERAGE FORWARD CURRENT AVERAGED OVER A FULL 60-HZ CYCLE |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 200.0 DEG CELSIUS JUNCTION |
| MATT | MATERIAL | SILICON SEMICONDUCTOR |
| TEST | TEST DATA DOCUMENT | 81349-MIL-PRF-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS,BROCHURES,ETC.,THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS,INDUSTRY DIRECTORIES,AND SIMILAR TRADE PUBLICATIONS,REFLEC |
| THSD | THREAD SERIES DESIGNATOR | UNF |
| TTQY | TERMINAL TYPE AND QUANTITY | 1 THREADED STUD AND 1 TAB,SOLDER LUG |
| ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-PRF-19500/260 GOVERNMENT SPECIFICATION |
| Relevant Components for NSN - 5961-00-523-9597, 5961005239597 | ||||
| 5985-01-083-2891 (5985010832891) | 5998-01-077-4262 (5998010774262) | 5915-01-341-7047 (5915013417047) | 5935-01-390-7789 (5935013907789) | |
| 5999-01-596-3085 (5999015963085) | 5950-00-938-5286 (5950009385286) | 5945-01-328-1508 (5945013281508) | 5945-00-225-4045 (5945002254045) | |
| 5998-00-408-3100 (5998004083100) | 5995-01-096-4535 (5995010964535) | 5910-00-113-9884 (5910001139884) | 5985-01-547-2844 (5985015472844) | |
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