HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS AND HIGH SPEED
CQSJ
INCLOSURE MATERIAL
CERAMIC AND GLASS
CQSZ
INCLOSURE CONFIGURATION
DUAL-IN-LINE
CQZP
INPUT CIRCUIT PATTERN
DUAL 4 INPUT
CSSL
DESIGN FUNCTION AND QUANTITY
2 DRIVER,LINE
CTFT
CASE OUTLINE SOURCE AND DESIGNATOR
T0-116 JOINT ELECTRON DEVICE ENGINEERING COUNCIL
CWSG
TERMINAL SURFACE TREATMENT
TIN
CZEQ
TIME RATING PER CHACTERISTIC
12.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 18.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
TEST
TEST DATA DOCUMENT
96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.).
Relevant Components for NSN - 5962-00-064-1798, 5962000641798
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