MONOLITHIC AND HERMETICALLY SEALED AND POSITIVE OUTPUTS
CQSJ
INCLOSURE MATERIAL
CERAMIC AND GLASS
CQSZ
INCLOSURE CONFIGURATION
DUAL-IN-LINE
CQWX
OUTPUT LOGIC FORM
DIODE-TRANSISTOR LOGIC
CQZP
INPUT CIRCUIT PATTERN
QUAD 2 INPUT
CSSL
DESIGN FUNCTION AND QUANTITY
4 GATE,NAND-NOR
CTFT
CASE OUTLINE SOURCE AND DESIGNATOR
T0-116 JOINT ELECTRON DEVICE ENGINEERING COUNCIL
CZEQ
TIME RATING PER CHACTERISTIC
30.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 80.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
TEST
TEST DATA DOCUMENT
96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.).
Relevant Components for NSN - 5962-00-478-4439, 5962004784439
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