Item Name | Microcircuit Memory |
Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
Federal Supply Class (FSC) | 5962 Microcircuits Electronic |
National Item Identification Number (NIIN) | 01-228-0135 (012280135) |
NCB Code | USA (01) |
Manufacturer | Datametrics Corporation, Raytheon Systems Ltd, Rugged Information Technology, Northrop Grumman Systems Corporation, Advanced Micro Devices Inc, Intel Corporation, Raytheon Company, Leonardo Mw Ltd |
Part Number | Manufacturer | Item Name | RFQ |
---|---|---|---|
760010-001 | datametrics corporation | microcircuit memory | RFQ |
MD102D20100S | raytheon systems ltd | microcircuit memory | RFQ |
760010-001 | rugged information technology | microcircuit memory | RFQ |
7141485-1 | northrop grumman systems corporation | microcircuit memory | RFQ |
AM8155DM-B | advanced micro devices inc | microcircuit memory | RFQ |
MD8155H B | intel corporation | microcircuit memory | RFQ |
72-00906-107 | raytheon company | microcircuit memory | RFQ |
999 4 43076 206 | leonardo mw ltd | microcircuit memory | RFQ |
MD8155 B | intel corporation | microcircuit memory | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 2.030 INCHES MINIMUM AND 2.080 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.515 INCHES MINIMUM AND 0.600 INCHES MAXIMUM |
ADAU | BODY HEIGHT | 0.140 INCHES MINIMUM AND 0.185 INCHES MAXIMUM |
AEHX | MAXIMUM POWER DISSIPATION RATING | 1.5 WATTS |
AFGA | OPERATING TEMP RANGE | -55.0 TO 125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | HIGH PERFORMANCE AND W/ENABLE AND W/RESET AND HERMETICALLY SEALED |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 35 INPUT |
CRHL | BIT QUANTITY | 2048 |
CSWJ | WORD QUANTITY | 256 |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS MAXIMUM POWER SOURCE |
CZER | MEMORY DEVICE TYPE | RAM |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.). |
TTQY | TERMINAL TYPE AND QUANTITY | 40 PRINTED CIRCUIT |
Relevant Components for NSN - 5962-01-228-0135, 5962012280135 | ||||
5985-01-360-2114 (5985013602114) | 5950-01-481-1072 (5950014811072) | 5910-01-015-2302 (5910010152302) | 5930-00-578-6955 (5930005786955) | |
5975-01-563-7366 (5975015637366) | 5950-01-261-6319 (5950012616319) | 5962-01-133-3642 (5962011333642) | 5915-01-464-8685 (5915014648685) | |
5935-00-763-8252 (5935007638252) | 5910-00-833-8207 (5910008338207) | 5905-01-258-4942 (5905012584942) | 5935-00-825-5145 (5935008255145) | |
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