Item Name | Microcircuit Memory |
Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
Federal Supply Class (FSC) | 5962 Microcircuits Electronic |
National Item Identification Number (NIIN) | 01-455-9723 (014559723) |
NCB Code | USA (01) |
Manufacturer | Philips Semiconductors Ltd, Texas Instruments Inc, Raytheon Company, Mmi Amd, Northrop Grumman Systems Corporation, Intersil Corporation, Military Specifications, Northrop Grumman Corporation, Advanced Micro Devices Inc |
Part Number | Manufacturer | Item Name | RFQ |
---|---|---|---|
CC1648 | philips semiconductors ltd | microcircuit memory | RFQ |
TBP18S030W | texas instruments inc | microcircuit memory | RFQ |
932623-505B | raytheon company | microcircuit memory | RFQ |
5331-1F | mmi amd | microcircuit memory | RFQ |
SN91027W | texas instruments inc | microcircuit memory | RFQ |
581R504H26 | northrop grumman systems corporation | microcircuit memory | RFQ |
B1585-505B | intersil corporation | microcircuit memory | RFQ |
MIL-M-38510/207 | military specifications | microcircuit memory | RFQ |
82S123A BFA | philips semiconductors ltd | microcircuit memory | RFQ |
HM9-7603 | intersil corporation | microcircuit memory | RFQ |
583R524H02 | northrop grumman systems corporation | microcircuit memory | RFQ |
BM0476-700 | northrop grumman corporation | microcircuit memory | RFQ |
53S081-1F | mmi amd | microcircuit memory | RFQ |
S82S123WJ | philips semiconductors ltd | microcircuit memory | RFQ |
AM27S19AFMB | advanced micro devices inc | microcircuit memory | RFQ |
1009 | mmi amd | microcircuit memory | RFQ |
584R267H02 | northrop grumman systems corporation | microcircuit memory | RFQ |
M38510/20704BFA | military specifications | microcircuit memory | RFQ |
S82S123AF883B | philips semiconductors ltd | microcircuit memory | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
CRTL | Criticality Code Justification | CBBL |
MRC | Decoded Requirement | Clear Text Reply |
CQSZ | Inclosure Configuration | FLAT PACK |
CBBL | Features Provided | PROGRAMMABLE AND ELECTROSTATIC SENSITIVE |
TEST | Test Data Document | 96906-MIL-STD-883 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS, BROCHURES,ETC., THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS, INDUSTRY DIRECTORIES, AND SIMILAR TRADE PUBLICATIONS, REFLECTING GENERAL TYPE DATA ON CERTAIN ENVIRONMENTAL AND PERFORMANCE REQUIREMENTS AND TEST CONDITIONS THAT ARE SHOWN AS "TYPICAL", "AVERAGE", "NOMINAL", ETC.). |
CXCY | Part Name Assigned By Controlling Agency | MED READ ONLY MEMORY APINTERFACE |
CZER | Memory Device Type | PROM |
AGAV | End Item Identification | B1B |
Relevant Components for NSN - 5962-01-455-9723, 5962014559723 | ||||
5985-01-360-2114 (5985013602114) | 5950-01-481-1072 (5950014811072) | 5910-01-015-2302 (5910010152302) | 5930-00-578-6955 (5930005786955) | |
5975-01-563-7366 (5975015637366) | 5950-01-261-6319 (5950012616319) | 5962-01-133-3642 (5962011333642) | 5915-01-464-8685 (5915014648685) | |
5935-00-763-8252 (5935007638252) | 5910-00-833-8207 (5910008338207) | 5905-01-258-4942 (5905012584942) | 5935-00-825-5145 (5935008255145) | |
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