Request a Quote on Advanced Testing Technologies Part Number B504OPTION500 with the NSN 6625-01-476-1772 Today!

Part Number: B504OPTION500

Manufacturer: Advanced Testing Technologies

NSN: 6625-01-476-1772

NIIN: 014761772

Item Name : Test Program Set

CAGE Code: 0DRX9

FSC: 6625 Electrical and Electronic Properties Measuring and Testing Instruments

FSG: 66 Instruments and Laboratory Equipment

Country: USA

NCB Code: 01

Thank you for taking an interest in the Test Program Set NSN parts that we carry here on Buy Military Ground Vehicle Parts. You have reached the RFQ page for part number B504OPTION500, an item that traces back to the manufacturer Advanced Testing Technologies. Listed with NSN 6625014761772, this listing is available for purchase from our website at any time. If you are interested in part number B504OPTION500 and wish to learn more, be sure to fill out and submit the RFQ form found on this page. By presenting us information such as your target price and expected delivery date, we can best formulate and present a solution that closely caters to your unique needs and restrictions alike.

Product Details

“*” Required Fields Are Compulsory

Contact Information

* By clicking this box, I acknowledge that I have read and accept the ASAP Semiconductor Terms and Conditions and agree that all quotes and purchase orders are exclusively subject to the ASAP Semiconductor Customer Terms and Conditions.

I consent to receive email communications from ASAP Semiconductor and can unsubscribe at any time.
ASAP Semiconductor is a wholly independent aftermarket parts distributor.
This website is intended for quotations based on part numbers only. Please DO NOT submit drawings, technical data, or other specifications through this portal.

Disclaimer: This is a quotation for the goods listed above. This quotation is meant as an estimate and does not reflect a final bill or invoice. All quotations are subject to change until acceptance by ASAP Semiconductor of a binding Purchase Order, and quotations may be withdrawn or revised at the sole discretion of ASAP Semiconductor. This quotation is subject to the ASAP Semiconductor Terms & Conditions available at https://www.asapsemi.com/terms-conditions.aspx . All United States Government and Department of Defense bids are quoted as CAGE code 6RE77 from ASAP Semiconductor’s Anaheim, California facility. Any quotation from ASAP Semiconductor without 6RE77 is void.

Note : We Will Not Share Your Information To Any Third Parties.

Upload RFQ SHEET

If you have more than one item, upload your spreadsheet here

Upload File

To make the part searching process as simple as possible, we choose to list offerings with as much relevant information as we can. For example, while part number B504OPTION500 is manufactured by Advanced Testing Technologies, it is specifically listed along with CAGE Code 0DRX9. With this identifier, you can trace this item back to the exact facility it was sourced from. Additionally, with the NSN 6625-01-476-1772, this signifies that the product belongs to the Federal Supply Class 6625 Electrical and Electronic Properties Measuring and Testing Instruments. Alongside our easy-to-navigate database, we also offer highly competitive pricing and rapid lead times for the benefit of our customers. Get in touch with an industry expert today and see why so many customers steadily depend on us for their operational needs.

Characteristics Data of NSN 6625-01-476-1772, 6625014761772

MRC	Criteria	Characteristic
MRC	Decoded Requirement	Clear Text Reply
CXCY	Part Name Assigned By Controlling Agency	OPTION 504 HIGH DIGITAL TEST SYSTEM
FEAT	Special Features	SAME AS THE BRAT B504 50 MHZ HIGHSPEED DIGITAL TEST SYSTEM; CAN BE USEDIN A VARIETY OF BRAT TEST STATION; RECONFIGURABLE WITH ROOM FOR EXPANSION; THE INTERFACE, 320/640 HIGH SPEED DIGITAL INPUT/OUTPUT PINS; HAS ANALOG TEST POINTS; MULTIPLE PROGRAMMABLE AC AND DC POWER SYSTEMS ARE RECONFIGURABLE PRECISION POWER SUBSYSTEMS; HIGH SPEED DYNAMIC DIGITAL; SEVEN DISTINCT I/O MEMORY TYPES DATA FORMATTING W/ PRECIES EDGE PLACEMENT; INTENED FOR USE IN AN AUTOMATIC TESTING ENVIRONMENT THAT REQUIRES HIGH SPEED DIGITAL STIMULUS AND RESPONSE CAPABILITIES FOR SERIAL AND PARALLEL TESTING; THIS BRAT SYSTEM IS IN AN MS-WINDOWS ENVIRONMENT; OPTION 500 ADDS INCREASED PIN COUNT FROM 640 TO 800+ TO ACCOMMODATE THE AMP (728I/O) AND THE VIM (637 I/O)
AJKE	End Item Source	0DRX9
AGAV	End Item Identification	USED WITH BRAT TEST STATIONS
AFJS	Portability Method	BRAKE TYPE CASTERS