Thank you for taking an interest in the Microcircuit Memory NSN parts that we carry here on Buy Military Ground Vehicle Parts. You have reached the RFQ page for part number 15-1326286-1, an item that traces back to the manufacturer General Dynamics Mission Systems. Listed with NSN 5962013757492, this listing is available for purchase from our website at any time. If you are interested in part number 15-1326286-1 and wish to learn more, be sure to fill out and submit the RFQ form found on this page. By presenting us information such as your target price and expected delivery date, we can best formulate and present a solution that closely caters to your unique needs and restrictions alike.
NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
---|---|---|---|---|---|---|
5962-01-375-7492 Item PartTypeName: MICROCIRCUIT,MEMORY | 5962 | 013757492 | 0 | N | B | |
CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
7 | B | A | 0 | |||
Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
15-1326286-1 | 5 | 2 | 3 |
MRC | Criteria | Characteristic |
---|---|---|
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.6 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |
CZER | MEMORY DEVICE TYPE | EPROM |
SPCL | SPECIAL TEST FEATURES | SELECTED AND TESTED FOR RADIATION HARDNESS |
ADAT | BODY WIDTH | 0.585 INCHES MINIMUM AND 0.605 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0/125.0 DEG CELSIUS |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CRTL | CRITICALITY CODE JUSTIFICATION | FEAT |
CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT,PROM,128K X 8 (27C010); MICROCIRCUIT,MEMORY DIGITAL,CMOS 128K X 8-BIT UVEPROM,MONOLITHIC SILICON |
CZZZ | MEMORY CAPACITY | 128K X 8 |
FEAT | SPECIAL FEATURES | ELECTROSTATIC DISCHARGE SENS/HARDNESS CRITICAL ITEM; SELECTED ITEM; SELECTED FROM P/N 5962-8961404MXX OR 5962-8961405MXX,CAGE 67268 |
NHCF | NUCLEAR HARDNESS CRITICAL FEATURE | HARDENED |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.). |
TTQY | TERMINAL TYPE AND QUANTITY | 32 PRINTED CIRCUIT |
ADAQ | BODY LENGTH | 1.660 INCHES MINIMUM AND 1.680 INCHES MAXIMUM |
CBBL | FEATURES PROVIDED | BURN IN,MIL-STD-883,CLASS B AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND RADIATION HARDENED AND ULTRAVIOLET ERASABLE AND TESTED TO MIL-STD-883 AND SELECTED ITEM |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CTQX | CURRENT RATING PER CHARACTERISTIC | 5.00 MICROAMPERES MAXIMUM INPUT |
CZEQ | TIME RATING PER CHACTERISTIC | 150.00 NANOSECONDS MINIMUM ACCESS AND 170.00 NANOSECONDS MAXIMUM ACCESS |
ADAU | BODY HEIGHT | 0.200 INCHES MINIMUM AND 0.220 INCHES MAXIMUM |
AEHX | MAXIMUM POWER DISSIPATION RATING | 330.0 MILLIWATTS |
AFJQ | STORAGE TEMP RANGE | -65.0/150.0 DEG CELSIUS |
AGAV | END ITEM IDENTIFICATION | HAC/RMPE REACT BASIC |
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